• MP300 TC3

MP300 TC3 Smart Card Anlyser

Smart cards tester featuring :

Numerous adjustable parameters
Perfect repeatability of test scenarios
Trace visualisation
Advanced measurements capabilities
Injection of perturbations in the dialog
The MP300 is an innovating concept of modular architecture. It is based on a powerful mother board and some dedicated modules for contact and contactless smart cards.
The MP300 TC3 is a highly customizable tester for smart cards. The MP300 TC3 enables the testing and the validation of smart cards, masks and applications at margin conditions.
The software provided will give you at a glance all the informations about your chips. Experts and non-experts can easily control the specifications of the chip through the different graphs.

Perturbations generation
Perturbations can be performed to check the behavior of the card against unaccustomed conditions such as:

  • Forced parity errors in emission and reception
  • Glitch generations on Vcc and Clock
  • Modification of timings (for example TA, TB, TCTH for ISO 7816-3)
  • ETU width adjustable
  • Protocol level perturbations

Static and dynamic measurements are available on any contact. Repeatability is ensured by a temperature sensor.
Parametric tests and other U/I measurements are used for the checking of the internal connections and behaviors of the chips to deal with the quality issues.

Open Platform
All the Micropross products are based on APIs and allows all customers to develop their own applications. Usual programming languages are supported.
High speed and easy communications are guaranteed by Ethernet and USB connections.
As with any Micropross product, our hot line and free software update are included during 12 months.


Available Tests / Electrical
Current measurement Available contacts : Contacts C1, C2, C3, C4, C6, C7, C8. Ranges available : +/- 100mA, +/- 25mA, +/- 5mA, +/- 500µA. Modes available : Dynamic mode : we give you an analog like vision of the current on the pin you chose from the moment you chose. Static mode : we give you the instant current value on the selected contact. Burst mode : 512000 current measurements are made with 40ns in between, on C1 and C6, to give an analog like display of the studied signal.
Leakage current measurement Available contacts : Contact C1, C2, C3, C4, C6, C7, C8. Measurement ranges : +/- 5mA, + - 500µA.
Open/Short Test Available contacts : Contact C1, C2, C3, C4, C5, C6, C7, C8. Forced current : Adjustable between –500µA and 500µA.
Parametric tests Available contacts : Contacts C1, C2, C3, C4, C6, C7, C8. Modes available : Force a current, measure a voltage. Force a voltage, measure a current.
Personalisation assisted by hardware Do not lose a microsecond while sending data to the chip thanks to the hardware assisted data sending mechanism.
SWP specific measurement functions S2 signal characterisation : Measurement of minimum and maximum values of the current on the S2 signal during a given period.
Voltage measurement Available contacts : Contacts C1, C2, C3, C4, C6, C7, C8. Range available : +/- 10V. Modes available : Dynamic mode : we give you an analog like vision of the voltage on the pin you chose from the moment you chose. Static mode : we give you the instant voltage value. Burst mode : 512000 voltage measurements are made with 40ns in between, on C1 and C6, to give an analog like display of the studied signal.
Available Tests / Logical
Anti tearing test Simulate the chip's immunity against tearing from the reader.
Concurrent I/O testing Simultaneous sending of characters in ISO/IEC 7816 and SWP, with a user defined time offset (can be 0 ns).
SWP framing tests Possibility to send frames at a bit per bit level, enabling the sending of data without bit stuffing, or with CRC errors.
Timing measurement Measure the chip's response to a command.
Communication USB 2.0, TCP/IP 10/100 Mbps, RS 232.
Sequencer Tests Generation of glitches on Vcc, C3, C6. Modification at a user defined moment of the state of a pin. Sending out of standard frames/provoking collisions. Creation of custom activation/deactivation sequences. Generation of parity errors on transmission, simulation of parity errors on reception. Management of triggers. Sudden modification of an electronic parameter. Definition of the time between two commands.
Size Weight (Unitary rack package) : 1.98kg. Dimensions : Width= 150mm, Height= 78mm, Depth= 270mm.
Spy Feature Accuracy : 20ns. Signals displayed : Signals C1, C2, C3, C4, C6, C7, C8. SWP S1, SWP S2. Trigger in. Trigger out. Protocols supported : ISO/IEC 7816-3, SWP, USB 2.0 (simultaneous spy possible without accuracy damage). Type of events displayed : Logical state change. Characters (ISO/IEC 7816, SWP, USB 2.0, USB-IC). Modification of baudrate. Clock frequency detection. Analog representation of the signals. I/O direction.
Triggers The MP300 TC3 offers 5 triggers, to synchronise or to be synchronised by external laboratory devices (oscilloscopes,...).
User Interface MPManager.
Programmable Parameters / ISO 7816 Communication
ISO 7816 ETU width : From 1 to 4096 clock cycles (bit sampling adjustable). BGT, initial ETU width : Adjustable in clock cycles. BWT, CWT, EGT, RGT, WWT : Adjustable in ETUs. Clock stop at high or low state : Adjustable. Clock stop tG and tH timings : Adjustable in clock cycles. Parity control : Can be forced to 0,1, odd, even. Input parity error checking : Can be disabled. Pull-up resistor : 5kΩ or 20kΩ by fixed pull-up resistor. Any value between 1kΩ and 100kΩ can be emulated.
Programmable Parameters / Physical
Frequency ISO 7816 clock frequency : 10kHz to 20MHz. ISO 7816 clocy duty cycle : 30% to 70%.
Pin states All pins are independent fom each other, and can be separately managed.
Rise and Fall Times Vcc : From 20ns to 1.8V/ms. C2, C3, C4, C6, C7, C8 : From 10ns to 5µs (500µs on C2). Each contact can be adjusted independently.
Voltages Vcc : 0V to 10V. Vol : 0V to 5V. Voh : 1V to 7V, Each contact can be adjusted independently. Vil : 0.2V to 5V. Vih : 1V to 6.8V.
Programmable Parameters / SWP
SWP Communication Baudrate : Adjustable from 49kbps to 1.9Mbps. SWP duty cycle (definition of SWP S1 high and low states duration) : Adjustable from 0% to 50%. SWP S2 detection threshold : Adjustable from 1nA to 1.1mA. Activation time, P2, P3 timings : Adjustable.
Programmable Parameters / USB-IC
USB-IC USB-IC specific attachment procedure : Managed by the tester. Voltage classes supported : 1.8V and 3.0V.
Software Development
Embedded development Recommended cross compiler : Windriver compiler (prefered version : 4.4b).
Remote development (the code is executed from the PC) Elements available : MPSDK .NET library available on demand. Communication Dll supplied. Supported programming languages : C, C++, VB, Java, .NET. Any language that supports Dll.
Supported Protocols
ISO/IEC 7816-3 Hardware acceleration : Transmission and reception of characters managed by the MicroSmart technology. T=0 and T=1 protocols : 100% implemented, managed by firmware.
SWP (ETSI TS 102 613 AND TS 102 622) SWP transmission : Assisted by hardware. LLC layers support : ACT, CLT and S-HDLC realised by firmware. Evolutivity : This tester can be upgraded to support future evolutions of the standard.
Synchronous chips (memory chips) Avalaible librairies : T2G, Eurochip, SLE 4442, SLE 4407, AT24CXX. Custom protocols development : Available. Hardware acceleration : Available.
USB 2.0 Available speeds : Low speed, full speed. Classes : ISO/IEC 7816-12, mass storage, custom protocols.
Supported Protocols / Contactless
Out of standard chips support Benefit from Micropross' experience in smart card programming.
Raw mode Gives the possibility to exchange frames without any protocolary encapsulation.

MP300 TC3

  • Product Code: MP300 TC3
  • $0.00

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